Contact Us

Dr Debbie Hammond d.hammond@sheffield.ac.uk

Prof. Graham Leggett
graham.leggett@shef.ac.uk

Kroto Research Institute
University of Sheffield
Broad Lane
Sheffield
S3 7HQ

SIMS Instrument ChamberWelcome to Sheffield Surface Analysis Centre

The SSAC is a facility based within the University of Sheffield providing access to state of the art surface analysis instrumentation for both commercial and academic research.

Our Services: In addition to our Supra Axis (XPS), Axis Ultra DLD (XPS) and TOF.SIMS5, we have facilities for carrying out atomic force microscopy (AFM), spectroscopic ellipsometry and contact angle goniometry.

Techniques available in the SSAC allow us to determine:

Please contact us to purchase analysis time or if you have any questions relating to your samples or our services.

Index link SupraXPS: X-ray photoelectron spectroscopySIMS: secondary ion mass spectrometryAFM: atomic force microscopySpectroscopic Ellipsometry