Contact Us

Dr Debbie Hammond

(0114) 2229431

Prof. Graham Leggett

Chemistry Department
University of Sheffield
Dainton Building
Brook Hill
S3 7HF

Horiba UVISEL Ellipsometry measures changes in the polarity of light after its' interaction with a material.

These changes reflect the optical properties and thickness of layers within the material, and are represented as amplitude ratios, Ψ, and phase differences, Δ.

Our UVISEL spectroscopic ellipsometer facilitates the non-destructive acquisition of thin film thickness and refractive index information in ambient conditions, and the subsequent modelling of complex multilayer systems.