TOF.SIMS 5 Secondary ion mass spectrometry provides detailed information on the elemental and molecular composition of the upper 2 - 3 nm of a surface.
Our TOF.SIMS 5 is equipped with a "reflectron" time of flight analyser and an optimised Bi cluster primary ion source, resulting in high mass resolution and sensitivity in the ppm/ppb range.
Basic Principle: an ion beam is rastered over the surface. Fragmentation of the surface results in the release of charged atoms and molecules. The time-of-flight of any molecular ion reaching the detector is converted into a molecular mass.